Full optical characterization of coherent x-ray nanobeams by ptychographic imaging
نویسندگان
چکیده
منابع مشابه
Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging.
We have employed ptychographic coherent diffractive imaging to completely characterize the focal spot wavefield and wavefront aberrations of a high-resolution diffractive X-ray lens. The ptychographic data from a strongly scattering object was acquired using the radiation cone emanating from a coherently illuminated Fresnel zone plate at a photon energy of 6.2 keV. Reconstructed images of the o...
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The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields of science. These new sources provide short, highly intense, and coherent X-ray pulses. In a variety of scientific applications these pulses need to be strongly focused. In this article, we demonstrate focusing of hard X-ray FEL pulses to 125 nm using refractive x-ray optics. For a quantitative analys...
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1European XFEL, Albert-Einstein-Ring 19, 22761 Hamburg, Germany 2Institut für Röntgenphysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany 3European Molecular Biology Laboratory Hamburg c/o DESY, Notkestraße 85, 22603 Hamburg, Germany 4Department of Pharmacy, University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, NL 5DESY Photon Science, Notkestraße 85. 20...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2011
ISSN: 1094-4087
DOI: 10.1364/oe.19.016324